Please use this identifier to cite or link to this item:
http://148.72.244.84/xmlui/handle/xmlui/10705
Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Intessar K.abd | - |
dc.contributor.author | Abtisam K.al-Bity | - |
dc.contributor.author | Ahmed A.Esmael | - |
dc.contributor.author | Salah A. Bayat | - |
dc.date.accessioned | 2023-12-06T07:11:21Z | - |
dc.date.available | 2023-12-06T07:11:21Z | - |
dc.date.issued | 2012 | - |
dc.identifier.issn | 2222-8373 | - |
dc.identifier.uri | http://148.72.244.84:8080/xmlui/handle/xmlui/10705 | - |
dc.description.abstract | In this paper wet etching was used to etch Si-wafers by chemical solution KOH at different temperature and concentrations, the results showed: - decreasing of the etching rate at higher KOH concentrations producing smooth surface, on the other hand by observing the etching rate as a function of temperature it shows that the etching rate increases with the increase of the etching temperature producing roughness surface. | en_US |
dc.description.sponsorship | https://djps.uodiyala.edu.iq/ | en_US |
dc.language.iso | en | en_US |
dc.publisher | university of Diyala | en_US |
dc.title | Chemical etching of Si-p-type wafers using KOH | en_US |
dc.type | Article | en_US |
Appears in Collections: | مجلة ديالى للعلوم الاكاديمية / Academic Science Journal (Acad. Sci. J.) |
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