Please use this identifier to cite or link to this item: http://148.72.244.84/xmlui/handle/xmlui/13017
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dc.contributor.authorHabeeb Shalal Jasim-
dc.date.accessioned2024-03-20T13:05:30Z-
dc.date.available2024-03-20T13:05:30Z-
dc.date.issued2009-12-01-
dc.identifier.citationhttps://djes.info/index.php/djes/article/view/691en_US
dc.identifier.issn1999-8716-
dc.identifier.urihttp://148.72.244.84:8080/xmlui/handle/xmlui/13017-
dc.description.abstractSemi conducting Znx Se1-x thin films were prepared at 480nm thickness on glass substrates at room temperature using vacuum evaporation technique .The electrical properties of Znx Se1-x thin films have been investigated , such as dc conductivity and Hall effect. The investigation showed that the composition range 0≤x≤0.3 has an influence on the electrical properties of the Znx Se1-x thin films . The dc conductivity experiment in the range of temperature 293-423 ok gave two activation energies Ea1& Ea2 which represented two types of conduction mechanisms . Ea1 & Ea2 have values 0.6 & 0.1eV respectively for x=0, while 1.01 &0.107 eV for x=0.3. Also the study showed that the dc conductivity σ=5.19x10-7 (Ω. cm)-1 for x=0 , and decreases with increasing zinc to 3.2x 10-7 (Ω. cm)-1 at x=0.3. Hall effect study appeared that the type of the carriers is p-type, their concentration is 1.6x108cm -3 and increases with increasing the fraction of composition x to 2.6x1010 cm-3 .Also the mobility of the carriers has good relation with zinc content xen_US
dc.language.isoenen_US
dc.publisherUniversity of Diyala – College of Engineeringen_US
dc.titleElectrical Properties of Znx Se1-X Thin Films Prepared by Thermal Evaporation Methoden_US
dc.typeArticleen_US
Appears in Collections:مجلة ديالى للعلوم الهندسية / Diyala Journal of Engineering Sciences (DJES)

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