Effect of Thickness on Some Structural and Optical of V2O5 Thin Films

Abstract

In this paper vanadium pentoxide thin films (V2O5) were prepared by the chemical spray pyrolysis technique on a glass substrate at temperature (350 0C) and by thickness (1000,830,660,360) nm. XRD investigations showed that all the films are polycrystalline in nature with an orthorhombic structure with preferred orientation along ( 001) plane . Some properties studied by X-ray diffraction such as average grain size where the results were (27 ,29 ,20 , 24) nm for thickness (1000 , 830 , 660 , 360) nm respectively, results of texture coefficient were (2.38 , 2.60 , 1.96 , 2.47) nm for thickness (1000 , 830 , 660 , 360) nm respectively, also lattice constant are calculate. Some optical properties as well as studied by using a (UV – Vis – NIR – Spectrophotometer ) and the test results showed that the films prepared with Transmittance not exceeding 35% in the visible region of the electromagnetic spectrum and increases with the decrease in thickness. Also the absorbance increase with the increase in thickness. The values of the direct band gap were (2.203, 2.294, 2.402, 2.500) eV for the thickness (1000, 830,660. 360) nm respectively.