Please use this identifier to cite or link to this item: http://148.72.244.84/xmlui/handle/xmlui/8732
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dc.contributor.authorT.A.AL-Dhahir-
dc.date.accessioned2023-11-09T09:03:09Z-
dc.date.available2023-11-09T09:03:09Z-
dc.date.issued2013-05-01-
dc.identifier.issn2222-8373-
dc.identifier.urihttp://148.72.244.84:8080/xmlui/handle/xmlui/8732-
dc.description.abstractIn this study, we report the quantitative phase analysis which is performed by Rietveld X-ray diffraction using “fullprof”( fullprof.2k,Version 5.00 - Jan2011-ILL JRC) program to four different samples of TiO2 . Titanium dioxide is formed of two phases, Anatase and Rutile with different weight percentage. Four samples under study , first is a nanopowder , second is thin a film ,third is the micropowder while the fourth is formed of 50:50 Anatase and Rutile TiO2 which is considered as standard. Retiveld refinement on X-ray data for the samples is performed . The obtained results have a good optimization between the observed x-ray diffraction pattern and that calculated by Retiveld. This optimization is determined according to Rp, Rwp and GOF . The accuracy check was done by examining the fourth sample by X-ray. Then, quantitative phases were calculated by comparing method which needs pure phases mixture. The final result shows that Retiveld refinement is more accurate than comparing method.en_US
dc.description.sponsorshiphttps://djps.uodiyala.edu.iq/pages?id=442en_US
dc.language.isoenen_US
dc.publisheruniversity of Diyalaen_US
dc.subjectRietveld method, Quantitative analysis , XRD, TiO2en_US
dc.titleQuantitative Phase Analysis for Titanium Dioxide From X-Ray Powder Diffraction Data Using The Rietveld Methoden_US
dc.typeArticleen_US
Appears in Collections:مجلة ديالى للعلوم الاكاديمية / Academic Science Journal (Acad. Sci. J.)

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