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http://148.72.244.84/xmlui/handle/xmlui/10695| Title: | Spectral study to investigate the structural properties of thin CdS films with different thicknesses by X-ray diffraction |
| Authors: | Ebtisam K.al- Bity Ahmad M. obead Rasha A. Abdullah Muhammad A. al_Aani |
| Keywords: | structural proparties CdS or thin film CdS |
| Issue Date: | 2012 |
| Publisher: | university of Diyala |
| Abstract: | A polycrystalline CdS Films have been evaporated by thermal evaporation technique with different thicknesses under vacuum of about 8 × 10 about 373 K on glass substrates, the films annealed at 573K for different duration times (60, 120 and180 min.). The structural properties of the films have been studied by X- ray diffraction technique, some structural parameters like miller indices, dstnd, dexp, I/Io stnd and I/Io have been calculated and compared for the CdS alloy and films. |
| URI: | http://148.72.244.84:8080/xmlui/handle/xmlui/10695 |
| ISSN: | 2222-8373 |
| Appears in Collections: | مجلة ديالى للعلوم الاكاديمية / Academic Science Journal (Acad. Sci. J.) |
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