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http://148.72.244.84/xmlui/handle/xmlui/14105| Title: | الرقيقة cu in se0.8 te0.2 .culn se0 te0.8 دراسة بعض الخواص الكهربائية لاغشية |
| Authors: | صباح انور سلمان تحسين حسين مبارك اسعد احمد كامل |
| Issue Date: | 2006 |
| Publisher: | مجلة الفتح للعلوم التربوية والنفسية |
| Citation: | http://148.72.244.84:8080/jspui/password-login |
| Series/Report no.: | 10;2 |
| Abstract: | It had been measuring the resistivity for the CuIn (Se0.2Te0.8)2 and CuIn (Se0.8Te0.2)2 thin films which perpetrated by vacuum thermal evaporation with a thickness of (225±5nm) in the thermal range of (300–473K) for both as deposited and annealed samples at temperatures (373K, 473K) for one hour in the existence vacuum (10-2Torr). It had been calculation activation energies for these films before and after annealing. |
| URI: | http://148.72.244.84:8080/xmlui/handle/xmlui/14105 |
| ISSN: | 1996-8752 |
| Appears in Collections: | مجلة الفتح / The Al-Fateh Journal for Educational and Psychological Research |
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